Journal:Technical Journal, 2017, Volume 22, Issue No 1
Author(s): Shahid Farid, M.Alam , A. Akbar, M. M. Iqbal, F. A. Siddiqui
Journal:Technical Journal, 2018, Volume 23, Issue No 2
Author(s): Saima Farhan, Muhammad Abuzar Fahiem, Huma Tauseef
Keyword(s): Classification, machine learning, Software Metrics, Software Defect Prediction