Abstract
Poly-crystalline Spintronics material (Hg0.8Cd0.2Te) was synthesized through solid state reaction method. The sample with the diameter of = 5 mm and thickness T = 1.5 mm was set via uni-axial persistent technique. Sample was melted at 800 0C up to 2 h. The sample was characterized through scanning electron microscopy (SEM), Energy dispersive x-rays (EDX), and X-rays diffraction (XRD) studies to confirm the surface morphology and structural analyses. From XRD results it was confirmed that sample structure was cubical. Lattice parameters was determined by XRD 0.65 nm of (Hg0.8 Cd0.2Te). Using crystallography method the miller indices (hkl) was also studied. The planes were observed (110), (210) and (331). From EDX results Te 42.82%, Cd 19.95%, Al 1.39%, O2 32.06 % and C 3.79% were found for 2 h heat treatment at 800 0C.
Keyword(s)
II–VI Materials, Sintering, Scanning Electron Microscopy, EDX, Grain Size